Tag Archives: measurement

Intel, NIST Researchers Measure Silicon Chip Dimensions with X-Ray Scattering Tech

The National Institute of Standards and Technology and Intel have used a critical-dimension small angle X-ray scattering method to measure nanostructured features of a silicon computer chip during a collaborative study. NIST said Tuesday it believes the CDSAXS technique could pave the way for development of new process control tools to help semiconductor …

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FDA OKs Philips Breast Cancer Risk Assessment Software; Phil Meyer Comments

The Food and Drug Administration has approved a Royal Philips-built software application designed to evaluate breast density in women who undergo digital mammograms. Philips’ Spectral Breast Density Measurement Application is intended to work with Philip’s MicroDose SI technology that is used for breast cancer screening, Philips said Thursday. According to …

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