Tag Archives: semiconductor industry

Intel, NIST Researchers Measure Silicon Chip Dimensions with X-Ray Scattering Tech

Intel, NIST Researchers Measure Silicon Chip Dimensions with X-Ray Scattering Tech - top government contractors - best government contracting event

The National Institute of Standards and Technology and Intel have used a critical-dimension small angle X-ray scattering method to measure nanostructured features of a silicon computer chip during a collaborative study. NIST said Tuesday it believes the CDSAXS technique could pave the way for development of new process control tools to help semiconductor …

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